著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Vourvopoulos, G. (George) and Doty, F. Patrick","Non-intrusive inspection technologies : 17-18 April 2006, Kissimmee, Florida, USA",,SPIE,2006,Proceedings,,0819462691,,https://cir.nii.ac.jp/crid/1130000796792337152