著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Yamada-Kaneta, Hiroshi and Sakai, Akira and International Conference on Defects-Recognition, Imaging and Physics in Semiconductors","Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan",,"Trans Tech Pubs., Ltd.",2012,Materials science forum,,9783037854426,,https://cir.nii.ac.jp/crid/1130000796798969344