著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Sadewasser, Sascha and Glatzel, Thilo",Kelvin probe force microscopy : from single charge detection to device characterization,,Springer,2018,Springer series in surface sciences,,9783319756868,,https://cir.nii.ac.jp/crid/1130000796801587840