著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Symposium on Defect Recognition and Image Processing in III-V Compounds and Weber, Eicke R.","Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987",,Elsevier,1987,Materials science monographs,,0444428925,,https://cir.nii.ac.jp/crid/1130000796865043584