著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Beenker, F. P. M. (Frans P. M.) and Bennetts, R. G. and Thijssen, A. P.",Testability concepts for digital ICs : the macro test approach,,Kluwer Academic Publishers,1995,Frontiers in electronic testing,,0792396588,,https://cir.nii.ac.jp/crid/1130000796871136000