著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Sachdev, Manoj",Defect oriented testing for CMOS analog and digital circuits,,Kluwer Academic Publishers,1998,Frontiers in electronic testing,,0792380835,,https://cir.nii.ac.jp/crid/1130000796948361856