著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Kaiser, Winfried M. and Stulen, Richard H. and Society of Photo-optical Instrumentation Engineers","Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA",,SPIE,2000,Proceedings,,0819437913,,https://cir.nii.ac.jp/crid/1130000797141100544