著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
IEEE Computer Society. Test Equipment Description Subcommitte,IEEE trial-use standard for Test Equipment Decription Language (TEDL),,Institute of Electrical and Electronics Engineers,1990,IEEE std,,1559370297,,https://cir.nii.ac.jp/crid/1130000797192021248