著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Ünlü, M. Selim and Symposium on Optical Microstructural Characterization of Semiconductors","Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.",,Materials Research Society,2000,Materials Research Society symposium proceedings,,1558994963,,https://cir.nii.ac.jp/crid/1130000797230490624