著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Geyl, Roland and Rimmer, David and Wang, Lingli","Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France",,SPIE,2004,Proceedings,,0819451363,,https://cir.nii.ac.jp/crid/1130000797240158336