著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Chen, Philip T. and Uy, O. Manuel","Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA",,SPIE,2000,Proceedings,,0819437417,,https://cir.nii.ac.jp/crid/1130000797343141376