Techniques for measuring the integrity of passivation overcoats on integrated circuits

Name: Techniques for measuring the integrity of passivation overcoats on integrated circuits
Author: Kern, Werner, Comizzoli, Robert B.

HathiTrust 1977 Web Site CiNii Available at 1 libraries

Bibliographic Information

Title: "Techniques for measuring the integrity of passivation overcoats on integrated circuits"

Publisher

Publication Year

Volume(Year)

Includes bibliographical references

CRID

1130000797457804032
NII Book ID

BB18756573
LCCN

76608229
Web Site

https://lccn.loc.gov/76608229

https://catalog.hathitrust.org/Record/003909530
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Washington
Classification
- LCC: QC100
- LCC: TK7874
- DC: 602/.1 s
- DC: 621.381/73
Subject
- LCSH: Integrated circuits -- Passivation
- LCSH: Protective coatings -- Testing
- LCSH: Microelectronics -- Quality control
Data Source
- CiNii Books