著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Hamdioui, Said","Testing static random access memories : defects, fault models, and test patterns",,Kluwer Academic,2004,Frontiers in electronic testing,,1402077521,,https://cir.nii.ac.jp/crid/1130000797583245056