著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Lall, Pradeep and Pecht, Michael G. and Hakim, Edward B.",Influence of temperature on microelectronics and system reliability,,CRC Press,1997,The electronic packaging series,,0849394503,,https://cir.nii.ac.jp/crid/1130000797613111808