著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Lee, John J. and Society of Photo-optical Instrumentation Engineers","Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia",,S.P.I.E.-- International Society for Optical Engineering,1983,Proceedings,,0892524510,,https://cir.nii.ac.jp/crid/1130000797635209728