著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Queisser, Hans J. and Electrochemical Society. Electronics Division and Electrochemical Society. Dielectric Science and Technology Division",Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects,,The Electrochemical Society,1994,Proceedings,,1566770378,,https://cir.nii.ac.jp/crid/1130000797643492608