著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Owsik, Jan and Więcek, Tomasz","Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland",,SPIE,1998,Proceedings,,0819436445,,https://cir.nii.ac.jp/crid/1130000797803583360