著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Leblebici, Yusuf and Kang, Sung-Mo",Hot-carrier reliability of MOS VLSI circuits,,Kluwer Academic,1993,The Kluwer international series in engineering and computer science,,079239352X,,https://cir.nii.ac.jp/crid/1130000797824342272