著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Two- and three-dimensional methods for inspection and metrology and Harding, Kevin G. and Society of Photo-optical Instrumentation Engineers","Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA",,SPIE,2005,Proceedings,,0819460249,,https://cir.nii.ac.jp/crid/1130000798069197184