著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Wang, Laung-Terng and Stroud, Charles E. and Touba, Nur",System-on-chip test architectures : nanometer design for testability,,Morgan Kaufmann Pub.,2008,The Morgan Kaufmann series in systems on silicon,,9780123739735,,https://cir.nii.ac.jp/crid/1130000798351700096