著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Assoufid, Lahsen and Takacs, Peter Z. and Ohtsuka, Masaru and Society of Photo-optical Instrumentation Engineers","Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA",,SPIE,2007,Proceedings,,9780819468529,,https://cir.nii.ac.jp/crid/1130000798366524416