著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Chin, Aland K. and Society of Photo-optical Instrumentation Engineers","Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA",,SPIE,2001,Proceedings,,0819439630,,https://cir.nii.ac.jp/crid/1130006728301644295