著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Geer, Robert E. and Society of Photo-optical Instrumentation Engineers and American Society of Mechanical Engineers and Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai) and Jet Propulsion Laboratory (U.S.) and National Science Foundation (U.S.)","Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA",,SPIE,2006,Proceedings,,0819462284,,https://cir.nii.ac.jp/crid/1130006960505264008