著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Jha, Niraj K. and Kundu, Sandip",Testing and reliable design of CMOS circuits,,Kluwer Academic Publishers,1990,The Kluwer international series in engineering and computer science,,0792390563,,https://cir.nii.ac.jp/crid/1130282268668891264