著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Symposium on Defect Recognition and Image Processing in III-V Compounds and Ogawa, T.","Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989",,North-Holland,1990,Journal of crystal growth,,,,https://cir.nii.ac.jp/crid/1130282268675248000