著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Mahapatra, Souvik","Fundamentals of bias temperature instability in MOS transistors : characterization methods, process and materials impact, DC and AC modeling",,Springer,2016,Advanced microelectronics,,9788132225072,,https://cir.nii.ac.jp/crid/1130282269098924800