著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Krstić, Angela and Cheng, Kwang-Ting",Delay fault testing for VLSI circuits,,Kluwer Academic Publishers,1998,Frontiers in electronic testing,,0792382951,,https://cir.nii.ac.jp/crid/1130282269332262912