著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Pearton, S. J. and Tavendale, A. J. and Williams, A. A.",Transient conductance spectroscopy measurements of defect states in γ-irradiated n-channel silicon field effect transistors with possible γ-dosemeter applications,,"Australian Atomic Energy Commission, Research Establishment",1980,AAEC/E,,0642597030,,https://cir.nii.ac.jp/crid/1130282269487208192