著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Conference on Defect Recognition and Image Processing in Semiconductors and Donecker, J. and Rechenberg, I.","Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997",,Institute of Physics,1998,Institute of Physics conference series,,0750305002,,https://cir.nii.ac.jp/crid/1130282269498791168