著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Stover, John C. and Society of Photo-optical Instrumentation Engineers","Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado",,SPIE-The International Society for Optical Engineering,1996,Proceedings,,0819422509,,https://cir.nii.ac.jp/crid/1130282269568707584