著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
SAE International,SAE residual stress measurement by x-ray diffraction,2003 ed,SAE International,2003,SAE international,,9780768010695,,https://cir.nii.ac.jp/crid/1130282269592228864