著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Sachdev, Manoj and Pineda de Gyvez, José",Defect-oriented testing for nano-metric CMOS VLSI circuits,2nd ed.,Springer,2007,Frontiers in electronic testing,,9780387465463,,https://cir.nii.ac.jp/crid/1130282269683957760