著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Hicks, John and De Forest, Peter R. and Baylor, Vivian M. and United States. National Institute of Standards and Technology and National Institute of Justice (U.S.) and Society of Photo-optical Instrumentation Engineers","Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts",,SPIE,1997,Proceedings,,0819423432,,https://cir.nii.ac.jp/crid/1130282269848857984