著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Gulati, Ravi K. and Hawkins, Charles F.",IDDQ testing of VLSI circuits,,Kluwer Academic Publishers,1993,Frontiers in electronic testing,,0792393155,,https://cir.nii.ac.jp/crid/1130282269893384576