著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices and Zemel, Jay N.",Nondestructive evaluation of semiconductor materials and devices,,Plenum Press,1979,NATO advanced study institutes series,,0306402939,,https://cir.nii.ac.jp/crid/1130282269973096192