著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL "Bhattacharya, Debashis and Hayes, John P. (John Patrick)",Hierarchical modeling for VLSI circuit testing,,Kluwer Academic Publishers,1990,The Kluwer international series in engineering and computer science,,079239058X,,https://cir.nii.ac.jp/crid/1130282270069587200