著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
American Society for Testing and Materials,"Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963",,ASTM,1964,ASTM special technical publication,,,,https://cir.nii.ac.jp/crid/1130282270078581120