著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
Symposium on Advances in electron Metallography and American Society for Testing and Materials. Committee E-4 on Metallography,"Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963",,ASTM,1964,ASTM special technical publication,,,,https://cir.nii.ac.jp/crid/1130282270174839296