著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Searle, Tim and INSPEC (Information service)",Properties of amorphous silicon and its alloys,,"INSPEC, Institution of Electrical Engineers",1998,EMIS datareviews series,,0852969228,,https://cir.nii.ac.jp/crid/1130282270310029952