著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Loretto, M. H. and Smallman, R. E.",Defect analysis in electron microscopy,,Chapman and Hall,1975,Science paperbacks,,"047054760X,0412137607,0412137704",,https://cir.nii.ac.jp/crid/1130282270343250944