著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Gusev, Evgeni",Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices,,Springer,2006,NATO science series,,"1402043651,140204366X",,https://cir.nii.ac.jp/crid/1130282270352521600