著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Two- and three-dimensional methods for inspection and metrology and Huang, Peisen S. and Society of Photo-optical Instrumentation Engineers","Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA",,SPIE,2006,Proceedings,,9780819464804,,https://cir.nii.ac.jp/crid/1130282270685141632