著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Chakradhar, Srimat T. and Agrawal, Vishwani D. and Bushnell, Michael L. (Michael Lee)",Neural models and algorithms for digital testing,,Kluwer Academic Publishers,1991,The Kluwer international series in engineering and computer science,,0792391659,,https://cir.nii.ac.jp/crid/1130282270744203008