著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Terman, Lewis Madison and Merrill, Maud A.",Measuring intelligence : a guide to the administration of the new revised Stanford-Binet tests of intelligence,,Houghton Mifflin company,1937,Riverside textbooks in education,,,,https://cir.nii.ac.jp/crid/1130282270802691712