Ion beam techniques for the analysis of light elements in thin films, including depth profiling : final report of a co-ordinated research project 2000-2003
CiNii
Available at 1 libraries
Bibliographic Information
- Title
- "Ion beam techniques for the analysis of light elements in thin films, including depth profiling : final report of a co-ordinated research project 2000-2003"
- Publisher
-
- International Atomic Energy Agency
- Publication Year
-
- 2004
- Book size
- 30 cm
Search this Book/Journal
Notes
Includes bibliographic references
IAEA-TECDOC-1409
- Tweet
Details 詳細情報について
-
- CRID
- 1130282270990444416
-
- NII Book ID
- BA78752405
-
- ISBN
- 9201104049
-
- Text Lang
- en
-
- Country Code
- au
-
- Title Language Code
- en
-
- Place of Publication
-
- Vienna
-
- Data Source
-
- CiNii Books