Ion beam techniques for the analysis of light elements in thin films, including depth profiling : final report of a co-ordinated research project 2000-2003

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Bibliographic Information

Title
"Ion beam techniques for the analysis of light elements in thin films, including depth profiling : final report of a co-ordinated research project 2000-2003"
Publisher
  • International Atomic Energy Agency
Publication Year
  • 2004
Book size
30 cm

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Notes

Includes bibliographic references

IAEA-TECDOC-1409

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Details 詳細情報について

  • CRID
    1130282270990444416
  • NII Book ID
    BA78752405
  • ISBN
    9201104049
  • Text Lang
    en
  • Country Code
    au
  • Title Language Code
    en
  • Place of Publication
    • Vienna
  • Data Source
    • CiNii Books
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