著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Symposium on Defect Recognition and Image Processing in III-V Compounds and Jiménez, J. (Juan)","Defect recognition and image processing in semiconductors and devices : proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993",,Institute of Physics Pub.,1994,Institute of Physics conference series,,0750302941,,https://cir.nii.ac.jp/crid/1130282271113039360