著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Pollak, Fred H. and Bauer, Robert S. and Society of Photo-optical Instrumentation Engineers","Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts",,SPIE -- the International Society for Optical Engineering,1984,Proceedings,,0892524871,,https://cir.nii.ac.jp/crid/1130282271119977472