著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy and Cherns, David and North Atlantic Treaty Organization. Scientific Affairs Division and Special Program on Condensed Systems of Low Dimensionality (NATO)",Evaluation of advanced semiconductor materials by electron microscopy,,Plenum Press,1989,NATO ASI series,,0306433621,,https://cir.nii.ac.jp/crid/1130282271311520640