著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Foster, Adam and Hofer, Werner",Scanning probe microscopy : atomic scale engineering by forces and currents,,Springer,2006,Nanoscience and technology,,0387400907,,https://cir.nii.ac.jp/crid/1130282271345594880