著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Richards, B. P. and Footner, P. K.",The role of microscopy in semiconductor failure analysis,,Oxford University Press : Royal Microscopical Society,1992,Microscopy handbooks,,0198564325,,https://cir.nii.ac.jp/crid/1130282271409283584